CONFERENCE PROGRAMME

The list of accepted contributions is available as a PDF file here.

Please, find the programme overview here below.

Click on a specific session to read the related list of contributions.

13 February, 2019

08:00 - 08:30

Registration

08:30 - 08:40

Opening address / Simone Carmignato, University of Padova

10:30 - 11:00

Coffee break

12:30 - 13:50

Lunch

15:50 - 16:20

Coffee break

14 February, 2019

08:00 - 08:30

Registration

08:30 - 09:00

KEYNOTE 1: “New developments in X-ray CT metrology for Industry 4.0”

Prof. W. Dewulf, KU Leuven, Belgium

10:20 - 10:50

Coffee break

12:30 - 13:50

Lunch

15:50 - 16:30

Coffee break

16:00 - 18:00

Poster Exhibition

15 February, 2019

08:00 - 08:30

Registration

08:30 - 09:00

KEYNOTE 2: “New applications of X-ray CT to characterisation and failure analysis in composite materials"

Prof. I. Sinclair, University of Southampton, UK

10:20 - 10:50

Coffee break

12:30 - 13:50

Lunch

15:30 - 16:00

CONFERENCE CLOSURE

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