■ THURSDAY, 14 FEBRUARY 2019
 
08:30 - 09:00
Keynote (I): “New developments in X-ray CT metrology for Industry 4.0” 
W. Dewulf, KU Leuven, Belgium
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09:00 - 10:20
"Metrology"
Session chairs: M. Bartscher, T. Takatsuji

Comparison of different measures for the single point uncertainty in industrial X-ray computed tomography

   Andreas Michael Müller, Institute of Manufacturing Metrology, Friedrich-Alexander-University Erlangen-Nuremberg, DE

Software-based compensation of computed tomography instrument misalignments – experimental study

   Evelina Ametova, Katholieke Universiteit Leuven, BE

CT geometry determination using individual radiographs of calibrated multi-sphere standards

   Benjamin A. Bircher, Federal Institute of Metrology METAS, CH

Uncertainty for uncorrected measurement results in X-ray computed tomography

   Herminso Villarraga-Gómez, Nikon Metrology, Inc., US

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